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the
Features AIS2000C
the
the
- Compact design for office environment
the
- Scanning electron microscope (SEM) production of "Seron Technology" mid-range, characterized by high competitiveness
the
- Powerful analysis software with universal feature
the
- Detector back-scattered electron ET (CRT) (mode of the scattered/backscattered electrons)
the
- Inspection of images in the conditions without coating
the
- Intuitive operating system
the
- Wysoka scan speed and high resolution, in pixels
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