Рентгенофлуоресцентный толщиномер - рентгенофлуоресцентные анализаторы химического состава сплавов и толщины покрытий

Система с возможностью микрофокусировки для неразрушающего контроля предназначены для измерения толщины однослойных, многослойных или сплавных покрытий, определения концентрации растворов, составов сплавов и анализа материалов методом энергодисперсионной рентгеновской флуоресценции.

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Russian software developer

Official Distributor

Commissioning
and maintenance

Delivery in any
point of Russia and the CIS

Guarantee
12 months

Description

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Microspot XRF coating thickness X-STRATA 920 and materials analysers for rapid quality control and validation testing, making it easy to get the right results in seconds.

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from Ti²² do U⁹² on the periodic table.

non-destructive analysis of the thickness of multilayer coatings and to determine chemical composition without prior surface preparation
Ability to work in 24/7
100% input control
Fast, precise, reliable measuring Range of elements from Ti to U
Layer thickness measurement in 5 layers (4 layers coating + base)
the at the same time chemical composition analysis of 25 items
the coverage Analysis at given points of the surface
Analysis of small samples ranging from 150 microns.
Analysis of solutions
Analysis of coatings on samples of irregular shapes (printed circuit boards, wire, etc.)
Detection of harmful impurities at the level of 10^-3– 10^-4 %
Export results in Excel Program to create reports

HITACHI (before Oxford Instruments) provides certified standards (for thickness) and ensuring reliable results the analyzer is the highest achievement for more than 25 years of experience Oxford Instruments

Flexible software on the basis of the Fundamental Parameters SmartLink® FP-based platforms Windows® XP, with a built-in report generator Report Generator, thickness Measurement up to 5 layers (4 layers plus base) / 15 elements / inter-element correction
Simultaneous analysis of 25 chemical elements
Analytical methods according to ISO 3497, ASTM B568, DIN 50987 and IEC 62321 independently Oxford Instruments manufactures x-ray tube power 50W (tungsten) which combines high stability, shorter time of measurement, reliability and long life.
High resolution Xe proportional detector ensures optimum efficiency accounts for all energy levels and improves the detection range of the elements
4096 channels of digital multichannel analyzer for high speed passing signal correction downtime and pulsation for better measurement statistics
Thermal stabilization software feature and Spec-Cal, the possibility of internal testing and automatic correction, ensure the good stability over time
Collimator of 0.3 mm ensures optimum focusing of the flow, expanding the measurement capability (optional)
Device for the primary filter optimizes conditions for the excitation and improves the ratio signal/noise
Laser automatically determines the correct focus position on the Z axis at a certain distance from the analyzed surface, thereby improving the accuracy of the result measuring the Size of the table: 560 mm x 600 mm, maximum sample height 33mm (maybe 160mm)
Robust and durable the case allows you to operate the analyzer in a production environment
Compact design allows you to place the analyzer on a small work surface
Service support is provided worldwide by experts in the field of x-ray fluorescence